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US4350889A - X-Ray fluorescent analysis with matrix compensation - Google Patents

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Introduction to X-ray Diffraction

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Please enable JavaScript to access the full features of the site or access our non-JavaScript page. Issue 9, Previous Article Next Article. From the journal: Journal of Analytical Atomic Spectrometry. You have access to this article. Please wait while we load your content Something went wrong. Try again? Cited by. Back to tab navigation Download options Please wait Article type: Atomic Spectrometry Update. DOI: Download Citation: J.

Charge-Coupled Device Advances For X-Ray Scientific Applications In

Vanhoof, J. Bacon, A. Ellis, U. Fittschen and L. Vincze, J. Search articles by author Christine Vanhoof. Jeffrey R. Andrew T. Ursula E.


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